Mfg Part Number: 5962-8866203NA | Alternate P/N: 59628866203NA | NSN : 5962-01-372-1262 |
NIIN : 013721262 | CAGE Code : 65786 | Manufacturer: Cypress Semiconductor Inc |
Item Name : Microcircuit Memory | FSC : 5962 Microcircuits Electronic |
Thank you for your interest in 5962-8866203NA, the Part number listed alongside the NSN 5962-01-372-1262. This particular 5962-8866203NA is manufactured by Cypress Semiconductor Inc, and we have current availability on our website now. If you are interested in this particular item, please fill out and submit the RFQ form as provided below at your earliest convenience. Once our team members receive a completed form, they will rapidly create a competitive quote that has been tailored with your individual needs and requirements in mind. With team members always available for customers 24/7x365, responses will be given in just 15 minutes or less.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-372-1262 Item Description: Microcircuit Memory | 5962 | 013721262 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
5962-8866203na | 2 | 1 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | HAC/RMPE REAC E/I FSCM 11293 |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | LEADED CHIP CARRIER |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,SRAM,32K X 8(CY7C197) |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM INPUT AND 6.0 VOLTS MAXIMUM INPUT |
CZEQ | TIME RATING PER CHACTERISTIC | 55.00 NANOSECONDS NOMINAL ACCESS |
CZER | MEMORY DEVICE TYPE | RAM |
CZES | HYBRID TECHNOLOGY TYPE | MONOLITHIC |
CZZZ | MEMORY CAPACITY | 128KX8 |
NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
TEST | TEST DATA DOCUMENT | 81349-MIL-M-38510 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
ZZZK | SPECIFICATION/STANDARD DATA | 67268-5962-8866203UA GOVERNMENT STANDARD |
ZZZX | DEPARTURE FROM CITED DESIGNATOR | MODIFIED FOR NUCLEAR HARDNESS IMPACT |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | C-11 MIL-M-38510 |
CBBL | FEATURES PROVIDED | RADIATION HARDENED AND ELECTROSTATIC SENSITIVE |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
FEAT | SPECIAL FEATURES | CBBL |
ZZZP | PURCHASE DESCRIPTION IDENTIFICATION | 11293-15-1326285-1 |
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